PIC Alignment Lab

Explore a synthetic optical-coupling surface and run a four-direction adaptive alignment search. All values are simulated, not laboratory measurements.

SIM / CONFIGURATION

Configure the search.

Offsets and mode widths below are expressed in micrometers (µm). The simulated optimum is at X = +7 µm, Y = −4 µm.

Initial X (µm)Initial Y (µm)Meter noise σ (dB)Measurement budget

Model: Gaussian lateral coupling, 7.5 µm × 4.5 µm widths, 1.2 dB minimum insertion loss. Coordinate search starts at 4 µm step and halves on unsuccessful scans. Random noise is deterministic per run.

SIM / RESULTS

INITIAL LOSS—

BEST OBSERVED LOSS—

MEASUREMENTS—

OBSERVED IMPROVEMENT—

Measured loss vs. observation index

Measured optical loss (synthetic)Lower is better

Running locally in your browser. No sensor, camera, physical PIC, or network API is involved.

Engineering limitations. This educational optimizer assumes a smooth 2-D coupling surface. Physical systems add angular and polarization effects, wavelength dependence, stage hysteresis, drift, and unknown optical mode shape. Reported results are not performance benchmarks.

Engineering purpose. The model isolates lateral alignment and noisy power measurement to illustrate a feedback-search problem. It is not a substitute for a calibrated optical stage or a characterization experiment.